Varex Imaging has been granted a patent for a system featuring multiple x-ray sources, each with distinct electron sources and targets. The design includes a linear arrangement of targets, allowing for varying electron beam currents at different focal spots, enhancing x-ray generation capabilities. GlobalData’s report on Varex Imaging gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Varex Imaging, Image segmentation techniques was a key innovation area identified from patents. Varex Imaging's grant share as of June 2024 was 62%. Grant share is based on the ratio of number of grants to total number of patents.
X-ray source system with linear targets and variable electron beams
The granted patent US12046442B2 describes a novel x-ray system comprising multiple x-ray sources, each featuring distinct electron sources and targets. The first x-ray source utilizes a field emitter for its electron source, while the second employs a different type of emitter, such as a filament or low work function emitter. The targets are arranged along a linear configuration, with each target positioned at varying locations. Notably, the maximum current of the electron beams emitted from the two sources differs, allowing for tailored x-ray generation at specific focal spots on the targets. The system also includes provisions for cooling the targets differently and may feature multiple emitters and focus electrodes to enhance beam control.
Additionally, the patent outlines methods for emitting x-ray beams from these sources, emphasizing the differences in electron sources and the resulting maximum currents. The method allows for the simultaneous operation of multiple emitters within the second x-ray source, enabling variable current emissions during different operational phases. The design of the targets and the arrangement of the collimators are also specified, ensuring that the x-ray beams are effectively directed. Overall, the patent presents a sophisticated approach to x-ray generation, focusing on the customization of electron sources and target configurations to optimize performance in various applications.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
