Ultra-low noise floor and flexible digital features optimize performance in test and measurement, communications and imaging applications
Texas Instruments Incorporated today introduced a family of 16-bit, single channel, 40- and 80-MSPS analog-to-digital converters (ADCs) which provide the highest signal-to-noise ratio (SNR) with very low power consumption. The devices’ low noise floor improves accuracy in test and measurement, receiver sensitivity in wireless communications, and image quality in medical, industrial and military applications.
The ADS5562, featuring a sample rate of 80 MSPS, and ADS5560, offering 40 MSPS, provide the highest signal-to-noise ratio (SNR) for input frequencies within the first Nyquist zone while consuming very little power. For instance, the ADS5562 offers 6 dB greater SNR and 0.6 more effective bits than any other 80-MSPS device consuming less than 900mW of power. The device also offers dynamic power scaling, reducing power consumption to as little as 540mW at 25 MSPS.
The ADS5562 and ADS5560 include an array of other digital features to give designers added flexibility. To further reduce noise, the devices offer a low-frequency noise suppression mode to eliminate the 1/f (flicker) noise, improving SNR by up to 4.2 dB over a 1-MHz band in baseband and time-domain applications.
In addition, programmable gain from 0dB to 6dB allows full scale outputs to be provided for input signals as low as 2V peak to peak (Vpp). To further add to the devices’ flexibility, designers can choose between parallel CMOS or fully-differential double data rate (DDR) LVDS outputs, which can enable up to 2dB additional SNR performance.
To simplify design and speed time to market, TI offers a wide variety of devices to complete the signal chain, including those listed below.